TY - BOOK AU - Lourenço,Nuno AU - Martins,Ricardo AU - Horta,Nuno ED - SpringerLink (Online service) TI - Automatic Analog IC Sizing and Optimization Constrained with PVT Corners and Layout Effects SN - 9783319420370 AV - TK7888.4 U1 - 621.3815 23 PY - 2017/// CY - Cham PB - Springer International Publishing, Imprint: Springer KW - Electronic circuits KW - Microprocessors KW - Electronics KW - Microelectronics KW - Circuits and Systems KW - Processor Architectures KW - Electronics and Microelectronics, Instrumentation N1 - Introduction -- Previous Works on Automatic Analog IC Sizing -- AIDA-C Architecture -- Multi-Objective Optimization Kernel -- AIDA-C Circuit Sizing Results -- Layout-Aware Circuit Sizing -- AIDA-C Layout-aware Circuit Sizing Results -- Conclusions; Available to subscribing member institutions only. Доступно лише організаціям членам підписки N2 - This book introduces readers to a variety of tools for automatic analog integrated circuit (IC) sizing and optimization. The authors provide a historical perspective on the early methods proposed to tackle automatic analog circuit sizing, with emphasis on the methodologies to size and optimize the circuit, and on the methodologies to estimate the circuit’s performance. The discussion also includes robust circuit design and optimization and the most recent advances in layout-aware analog sizing approaches. The authors describe a methodology for an automatic flow for analog IC design, including details of the inputs and interfaces, multi-objective optimization techniques, and the enhancements made in the base implementation by using machine leaning techniques. The Gradient model is discussed in detail, along with the methods to include layout effects in the circuit sizing. The concepts and algorithms of all the modules are thoroughly described, enabling readers to reproduce the methodologies, improve the quality of their designs, or use them as starting point for a new tool. An extensive set of application examples is included to demonstrate the capabilities and features of the methodologies described UR - https://doi.org/10.1007/978-3-319-42037-0 ER -