VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers / [electronic resource] : / edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh.. — 1st ed. 2017.. — XXI, 815 p. 486 illus. : online resource. — (Communications in Computer and Information Science,) 711 1865-0929 ;. - Communications in Computer and Information Science, 711 .

Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification.

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Анотація:
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

ISBN: 9789811074707

Standard No.: 10.1007/978-981-10-7470-7 doi

Subjects--Topical Terms:
Computer hardware.
Microprocessors.
Computer communication systems.
Computer Hardware.
Processor Architectures.
Computer Communication Networks.

LC Class. No.: QA75.5-76.95 TK7885-7895

Dewey Class. No.: 004