TY  - BOOK
AU  - Kaushik,Brajesh Kumar
AU  - Dasgupta,Sudeb
AU  - Singh,Virendra
ED  - SpringerLink (Online service)
TI  - VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers 
T2  - Communications in Computer and Information Science,
SN  - 9789811074707
AV  - QA75.5-76.95 
U1  - 004 23
PY  - 2017///
CY  - Singapore
PB  - Springer Singapore, Imprint: Springer
KW  - Computer hardware
KW  - Microprocessors
KW  - Computer communication systems
KW  - Computer Hardware
KW  - Processor Architectures
KW  - Computer Communication Networks
N1  - Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification; Available to subscribing member institutions only. Доступно лише організаціям членам підписки
N2  - This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification
UR  - https://doi.org/10.1007/978-981-10-7470-7
ER  -