TY  - BOOK
ED  - Symposium on Applications of Electron Microfractography to Materials Research
ED  - American Society for Testing and Materials.
TI  - Applications of electron microfractography to materials research
T2  - ASTM special technical publication 493
AV  - TA460 .S913 1970
U1  - 620.1/6/6028 
PY  - 1971///]
CY  - Philadelphia
PB  - American Society for Testing and Materials
KW  - Fractography
KW  - Congresses
KW  - Electron microscopy
KW  - Fractographie
KW  - Congrès
KW  - Microscopie électronique
N1  - "Presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970."; Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals; Includes bibliographical references; Also issued online
UR  - http://www.archive.org/details/applicationsofel00symp
UR  - http://www.openlibrary.org/books/OL5705696M
ER  -