Physical measurement and analysis of thin films, [electronic resource] / edited by E. M. Murt and W. G. Guldner.. — New York, : Plenum Press,, 1969.. — xi, 194 p. : illus. 24 cm. — (Progress in analytical chemistry v. 2).

Includes bibliographies.



LCCN: 68031239

Subjects--Topical Terms:
Thin films.

LC Class. No.: QC176 / .E2 1967

Dewey Class. No.: 530.4/1