Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore / [electronic resource] 1996 IEEE International Workshop on Memory Technology, Design, and Testing / edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.. — Los Alamitos, Calif. : : IEEE Computer Society Press,, c1996.. — ix, 123 p. : : ill. ; 28 cm.

"IEEE catalog number 96TB100042"--T.p. verso.

Includes bibliographical references and index.





ISBN: 0818674660 9780818674662

Subjects--Topical Terms:
Semiconductor storage devices--Testing--Congresses.
Random access memory--Congresses.

LC Class. No.: TK7895.M4 / I335 1996