Nanomanufacturing and Metrology [electronic resource] / edited by Fengzhou Fang, Wei Gao, Jingjing He.
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Серіальне виданняПублікація: Singapore : Springer Nature Singapore : Imprint: Springer.Опис: online resourceISSN: - 2520-8128
Nanomanufacturing and Metrology is a peer-reviewed, international and interdisciplinary research journal and is the first journal over the world that provides a principal forum for nano-manufacturing and nano-metrology. Nanomanufacturing and Metrology publish in the form of original articles, cutting-edge communications, timely review papers, technical reports, and case studies. Special issues devoted to developments in important topics in nano-manufacturing and metrology will be published periodically. Nanomanufacturing and Metrology publishes articles that focus on, but are not limited to, the following areas: Nano-manufacturing and metrology Atomic manufacturing and metrology Micro-manufacturing and metrology Physics, chemistry, and materials in micro-manufacturing, nano-manufacturing, and atomic manufacturing Tools and processes for micro-manufacturing, nano-manufacturing and atomic manufacturing.
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