Уточніть Ваш пошук
Наявність
-
Автори
-
Типи одиниць
-
Серія
-
Рубрики
- Characterization and Evaluation of Materials
- Condensed matter
- Condensed Matter Physics
- Electronics
- Electronics and Microelectronics, Instrumentation
- Magnetic materials
- Magnetism
- Magnetism, Magnetic Materials
- Materials science
- Materials—Surfaces
- Measurement
- Measurement Science and Instrumentation
- Microelectronics
- Microscopy
- Nanoscale science
- Nanoscale Science and Technology
- Particle acceleration
- Particle Acceleration and Detection, Beam Physics
- Surfaces and Interfaces, Thin Films
- Thin films
- Показати більше
- Показати менше
-
Мови